Catalog Description

Modern optical metrology with emphasis on non-destructive testing; Fourier optics; Moir{\'e} and polarization methods; classic and holographic interferometry; speckle techniques; fringe analysis. Prerequisite: Physical Optics EE450

Course Objectives

At the end of this course, all students should be able to

  1. Explain basic concepts involved in optical surface metrology.
  2. Understand single point techniques: triangulation, dynamic focusing, confocal, and chromatic
  3. Understand imaging techniques: fringe projection, deflectometry, confocal, and interferometry
  1. Introduction
    • Interference
    • Diffraction
    • Lab: Michelson Interferometer

  2. Holography
    • Phase hologram
    • Volume Hologram
    • Holographic Interferometry
    • Lab: Digital Holography

  3. Moir{\'e} Methods
    • Sinusoidal Gratings
    • In plane deformation
    • Out of plane deformation
    • Lab: Reflection Moir{\'e

      }

  4. Speckle Methods
    • Speckle Effect
    • Speckle Size
    • Speckle Correlation
    • Lab: Stacked Speckle

  5. Photoelasticity
    • Polarization
    • Phase Measurement
    • Phase Unwrapping
    • Lab: Stress Analysis

  6. Fringe Analysis
    • 1D phase unwrapping
    • 2D phase unwrapping
    • residuals
    • Lab: Optical Vortices

  7. Fourier Optics
    • lens
    • aberrations
    • image formation
    • Lab: Optical Image Processing

  8. ESPI
    • Out of plane displacement
    • Out of plan vibration
    • In plane measurement
    • Lab:

  9. Fizeau Interferometer
    • Fizeau's experiment
    • Test surfaces
    • Computer generated holograms
    • Lab: Fizeau interferometer

  10. Twyman-Green Interferometer
    • Mach-Zender
    • Shearing
    • Optical component aberrations
    • Lab: Testing Spherical Surfaces