Catalog Description
Modern optical metrology with emphasis on non-destructive testing; Fourier optics; Moir{\'e} and polarization methods; classic and holographic interferometry; speckle techniques; fringe analysis. Prerequisite: Physical Optics EE450
Course Objectives
At the end of this course, all students should be able to
- Explain basic concepts involved in optical surface metrology.
- Understand single point techniques: triangulation, dynamic focusing, confocal, and chromatic
- Understand imaging techniques: fringe projection, deflectometry, confocal, and interferometry
- Introduction
- Interference
- Diffraction
- Lab: Michelson Interferometer
- Holography
- Phase hologram
- Volume Hologram
- Holographic Interferometry
- Lab: Digital Holography
- Moir{\'e} Methods
- Sinusoidal Gratings
- In plane deformation
- Out of plane deformation
- Lab: Reflection Moir{\'e
}
- Speckle Methods
- Speckle Effect
- Speckle Size
- Speckle Correlation
- Lab: Stacked Speckle
- Photoelasticity
- Polarization
- Phase Measurement
- Phase Unwrapping
- Lab: Stress Analysis
- Fringe Analysis
- 1D phase unwrapping
- 2D phase unwrapping
- residuals
- Lab: Optical Vortices
- Fourier Optics
- lens
- aberrations
- image formation
- Lab: Optical Image Processing
- ESPI
- Out of plane displacement
- Out of plan vibration
- In plane measurement
- Lab:
- Fizeau Interferometer
- Fizeau's experiment
- Test surfaces
- Computer generated holograms
- Lab: Fizeau interferometer
- Twyman-Green Interferometer
- Mach-Zender
- Shearing
- Optical component aberrations
- Lab: Testing Spherical Surfaces